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Empowering DTCO Innovation with AI and Machine Learning(第1版)

Empowering

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訂購需時10-14天
9786264420419
Hock Chen
五南
2025年12月25日
133.00  元
HK$ 126.35  






ISBN:9786264420419
  • 規格:平裝 / 160頁 / 20k / 23 x 17 x 0.7 cm / 普通級 / 全彩印刷 / 初版
  • 出版地:台灣


  • 電腦資訊 > 概論/科技趨勢 > 人工智慧/機器學習











    Core Insight:

    Cross-Domain Data Collaboration: Unlocking Chip Potential

    Eliminating the "efficiency gap" caused by knowledge silos is the starting point for industry potential. Data doesnt lie; Data Science provides the solution: Through innovation and cross-domain restructuring, we visualize results to become the critical accelerator for boosting efficiency.



    GenAI Reshaping the Future of Semiconductors

    Facing the immense challenge of the slowing pace of Moores Law, the semiconductor industry urgently requires new breakthroughs. This book is specifically designed to solve the "Efficiency Black Hole" that consumes tens of billions of dollars annually in the industry.

    The Empowering DTCO Innovation with AI and Machine Learning offers readers a practical DTCO.ML Framework, demonstrating how to leverage Machine Learning (ML) and Generative AI (GenAI) technologies to inject new acceleration into chip manufacturing processes. Learn to master process variability and optimize chip energy efficiency, eliminating the time-consuming and costly physical tape-out trial-and-error cycle.

    You Will Master: How to use data to transform Yield improvement from relying on lengthy trial-and-error into a predictable, controllable process with Accelerated ROI; achieving significant Energy Efficiency (EE) leaps in every product iteration; and gaining a Time-to-Market (TTM) competitive advantage of several months for your team.

    Whether you are a chip design engineer, process R&D expert, or a manager seeking industry "re-acceleration" strategies, this book provides a validated AI-enabled strategy and execution blueprint. The future of DTCO starts here


     





    Table of Contents



    Foreword

    AI-Driven Semiconductor Chip Design Efficiency and Productivity Revolution



    Part I: Design Technology Co-Optimization, DTCO

    Chapter 1 Overview and Evolution of DTCO

    1.1 Principles of Design for Productivity

    1.2 Design Methodology for Ultimate Efficiency

    1.3 Future Directions of DTCO



    Chapter 2 Key Challenges and Strategies in Driving DTCO

    2.1 Key Challenges in Implementing DTCO

    2.2 Demand for Innovative Design Methods

    2.3 Productivity Optimization Platform Development



    Chapter 3 Optimizing Chip Energy Efficiency and Productivity

    3.1 Preparatory Work Before Project Initiation

    3.2 Custom Cell and Timing Signoff Strategy

    3.3 Process Optimization and Analysis Techniques

    3.4 Compensation Mechanism Design and Implementation

    3.5 Challenges and Demands of Near-Threshold Voltage Technology



    Part II: DTCO.ML ? : Machine Learning-Driven Semiconductor Process Optimization

    Chapter 4 The Integration of Machine Learning and DTCO (DTCO.ML ? )

    4.1 Virtual Wafer Data Modeling (Virtual Silicon)

    4.2 Building and Inferring Regression Models

    4.3 Application of Data Tracking and Production Optimization



    Chapter 5 Library Metric Extraction and Analysis System (libMetric ? )

    5.1 Cell Timing and Power Modeling

    5.2 Cell Feature Extraction

    5.3 RO Simulation

    5.4 Standard Cell Library Batch PPA Benchmarking



    Chapter 6 On-Chip Sensor Design and Integration (GRO Compiler)

    6.1 Goal-Oriented RO Design

    6.2 SPICE-to-Silicon Correlation

    6.3 Process Monitoring and Optimization

    6.4 On-Chip Effective Voltage Analysis

    6.4.1 Local Voltage Distribution Monitoring

    6.4.2 Compensation Strategy

    6.4.3 Dynamic Timing Slack Alerts and Layout

    6.5 GRO Automation Tool and Verification Process



    Chapter 7 Data Analysis and Machine Learning Platform (Copernic ? )

    7.1 Data Standardization and Visualization

    7.2 Cross-Domain Mapping of Multi-Dimensional Data

    7.3 Design Flow Integration Strategy

    7.3.1 WAT-aware Timing Re-K

    7.3.2 WAT-CP Mapping and Correlation Analysis

    7.3.3 OCV Analysis

    7.4 OCV Analysis and Design Margin Optimization

    7.5 Post-Silicon Analysis and Optimization



    Chapter 8 Chip Performance Rating Strategy and Optimization (Binning-PG ? )

    8.1 Impact of Binning Strategy on Productivity

    8.2 Chip Characteristics Analysis and Challenges

    8.3 Binning Policy Generation (Binning-PG ? )

    8.4 Automated Policy Generation and Optimization

    8.5 On-chip Self-binning Application



    Part III: DTCO.GenAI ? : Generative AI-Driven Chip Design Innovation

    Chapter 9 Generative AI and DTCO Integration (DTCO.GenAI ? )

    9.1 Limitations of Traditional Modeling Methods

    9.2 Following the Trail: Multivariate Normal Distribution

    9.3 Virtual Silicon Data in DTCO (DTCO.VS)



    Chapter 10 Virtual Silicon Data Generation Technology (DTCO.VS)

    10.1 Dataset Preparation

    10.2 GAN-based Virtual Silicon (GAN-VS)

    10.2.1 GAN Model

    10.2.2 GAN Model Performance Evaluation

    10.3 Diffusion Model-based Virtual Silicon (DM-VS)

    10.3.1 Denoising Diffusion Probabilistic Model (DDPM))

    10.3.2 Diffusion Model Performance Evaluation



    Chapter 11 Generative AI-Driven Chip Efficiency Optimization and Modeling

    11.1 WAT Super Resolution (WAT-SR)

    11.2 High-Efficiency SPICE-Silicon Bias Modeling (He-SSBM)

    11.2.1 Design Principle of One-shot SPICE-Silicon N/P Correlation

    11.2.2 Design and Signoff Strategy Optimization

    11.3 High-Fidelity Generative Monte Approximation (HΣ- GMA)

    11.3.1 Limitations of Traditional Monte Carlo Methods

    11.3.2 Innovative Application of Generative Neural Networks



    Chapter 12 Conclusion and Outlook

    12.1 AI-Enhanced DTCO: Revolutionizing Chip Design and Process Optimization (DTCO.ML ? )

    12.2 Generative AI-Driven Optimization (DTCO.GenAI ? )

    12.3 EDA Innovation and Future Outlook



    Appendix

    Open Source Resource List

    Reference List

    Glossary of Terms?





    Preface

    In the era of AI-driven innovation, the semiconductor industry is shifting from traditional yield optimization to comprehensive productivity enhancement. To stay competitive, chip design now focuses on enhancing performance, production capacity, and market competitiveness, beyond just yield and cost. This book explores how AI can optimize design margins, timing signoff, testing strategies, data analysis, process adjustments, binning strategies, and system-level compensation, driving a revolution in semiconductor design and productivity.



    Book Positioning

    This book approaches semiconductor design from a physical implementation perspective, focusing on the application of machine learning (ML) in Design-Technology Co-Optimization (DTCO). It covers traditional ML and cuttingedge generative AI (GenAI), exploring strategies to enhance chip performance and productivity.



    Target Audience

    Semiconductor Professionals: Chip design engineers, EDA developers, and researchers, offering practical examples and insights.

    Cross-Disciplinary Researchers: Helping them understand DTCO and explore AI applications.



    Book Structure

    We introduce DTCO principles, discuss machine learning applications in optimization, and analyze how generative AI shapes the future of semiconductor design. The book also explores innovative EDA development, showing how new technologies improve design efficiency and performance.




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